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介绍 Stratix® IV 设备中的错误检测循环冗余检验 （CRC） 和 SEU 缓解
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Stratix® IV Device Handbook, Volume 1, Chapter 12: JTAG Boundary-Scan Testing
Describes IEEE 1149.1 (JTAG) Boundary-Scan Testing in Stratix® IV Devices
Stratix® IV Device Handbook, Volume 1: Device Core, I/O Interfaces, and System Integration
This section provides a description of transceiver architecture and transceiver clocking for the Stratix® IV device family. It also describes configuring for multiple protocols and data rates, reset control and power down, and dynamic configuration for Stratix IV devices.
Stratix® IV Device Handbook, Volume 1, Chapter 10: Configuration, Design Security, and Remote System Upgrades
Which configuration schemes are supported and how to execute required configuration schemes.
Stratix® IV Device Handbook, Volume 1, Chapter 9: Hot Socketing and Power-On Reset
Describes hot socketing and power-on reset in Stratix® IV Devices